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Backlight series
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Parallel backlight FP
model:


product overview specification parameter table product dimension drawing

Features

·Have better uniformity

·Soft and natural light, high brightness

·Good light parallelism

·Compact structure saves installation space

·High brightness


Application scope:

·Contour detection

·Workpiece size measurement

·Detection of surface scratches, internal relics, damage, etc. of Ooming objects

·Film stain detection


Model composition description:

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Illuminance curve graph:


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Note: The data is for reference only and there may be actual errors.



Application cases:

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