Backlight series
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Parallel backlight FP
model:
product overview
specification parameter table
product dimension drawing
Features:
·Have better uniformity
·Soft and natural light, high brightness
·Good light parallelism
·Compact structure saves installation space
·High brightness
Application scope:
·Contour detection
·Workpiece size measurement
·Detection of surface scratches, internal relics, damage, etc. of Ooming objects
·Film stain detection
Model composition description:

Illuminance curve graph:

Note: The data is for reference only and there may be actual errors.
Application cases:



